IR microscope system
Non-destructive testing with infrared light
The IR microscope system SK19001-300 is a non-destructive inspection system that uses near-infrared light that passes through silicon wafers, allowing for visual confirmation of defects inside the wafer and the condition of the bonding surfaces on a PC screen.
- Company：アド・ソアー 湘南開発センター
- Price：5 million yen-10 million yen
